Verify
Incoming PCB
Check
specification requirements
Identify
presence of lead
Our XRF examination
X-ray fluorescence spectroscopy is an excellent and rapid tool for the chemical characterization of samples, especially metallic ones, and allows us, among other things, to identify the presence of substances such as lead and cadmium, banned by the RoHS regulation.
Furthermore, through the use of specific and finely calibrated programs, the Fischerscope X-DAL instrument is able to return precise thickness measurements of the main finishes used in electronics (e.g. Nickel and Gold layers for the ENIG finish), making it possible to carry out incoming checks for new supply batches or to identify non-compliant conditions in failure analyses.
